职位描述
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61Develop wafer level cost effective test solution for BST ASIC mass production, including test program and test hardware
61Support test plan definition for IC production and characterization test and discuss with designer about test feasibility;
61Define the tester configuration on the target ATE platform based the test requirement
61Enable the final mass production environment at OSAT.
61Develop wafer level/sample level test solution for BST ASIC Characterization, including test program and test hardware, support the Characterization data analysis
61Support test plan definition for IC production and characterization test and discuss with designer about test feasibility;
61Define the tester configuration on the target ATE platform based the test requirement
61Enable the final mass production environment at OSAT.
61Develop wafer level/sample level test solution for BST ASIC Characterization, including test program and test hardware, support the Characterization data analysis
工作地点
地址:上海长宁区虹桥临空经济园区福泉北路333号
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职位发布者
HE F..HR
博世(中国)投资有限公司
- 汽车·摩托车
- 1000人以上
- 外商独资·外企办事处
- 成都市天府大道中段1268号天府软件园E区E2栋13楼